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Optical Characterization Methods For Materials, Processing, And Manufacturing In The Semiconductor Industry

IC 107446 under ICR 199112-0693-001 · OMB 0693-0014.

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IC Title:

OPTICAL CHARACTERIZATION METHODS FOR MATERIALS, PROCESSING, AND MANUFACTURING IN THE SEMICONDUCTOR INDUSTRY

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Is this a Common Form? No

IC Status: Migrated

Obligation to Respond: Voluntary

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Number of Respondents: 50

Number of Respondents for Small Entity: 0

Affected Public: Private Sector

Private Sector: Businesses or other for-profits

Percentage of Respondents Reporting Electronically: 0 %

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	Approved	Program Change Due to Agency Discretion
Annual Number of Responses for this IC	50	50
Annual IC Time Burden (Hours)	50	50
Annual IC Cost Burden (Dollars)	0	0

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