OMB control number
Optical Characterization Methods For Materials, Processing, And Manufacturing In The Semiconductor Industry
OMB 0693-0014 ยท DOC/NIST.
OMB 0693-0014
Latest Forms, Documents, and Supporting Material
| Document | Type |
|---|---|
 OPTICAL CHARACTERIZATION METHODS FOR MATERIALS, PROCESSING, AND MANUFACTURING IN THE SEMICONDUCTOR INDUSTRY |
Information collection |
All Historical Document Collections
| Reference | Filing | Received | Concluded | Action |
|---|---|---|---|---|
| 199112-0693-001 | New collection (Request for a new OMB Control Number) | 1991-12-18 | Approved without change |